Several types of dielectric resonators for precise measurements of electromagnetic properties of materials at microwave frequencies.
QWED manufactures several types of resonators (also referred to as test fixtures) for precise measurements of electromagnetic properties of materials at microwave frequencies. Each resonator is equipped with specialised software for extracting the relevant data (typically, complex permittivity or real permittivity and loss tangent) from measurements. The resonators and the accompanying software are based on years of research led by QWED's expert Prof. Jerzy Krupka and documented in dozens of worldwide-appreciated scientific and technical publications. The quality of the resonators has been recognised by industrial practitioners, leading researchers, and industrial standard creators. QWED is especially proud of recognition by Keysight Technologies... read more
Split post dielectric resonators (SPDR)
SPDRs are intended for the measurements of the complex permittivity of laminar dielectric materials including LTCC substrates, but also thin ferroelectric films deposited on low loss dielectric substrates.

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Single post dielectric resonators (SiPDR)
SiPDRs are intended for the measurements of the surface impedance of metamaterials and resistive films as well as for the contact-less measurements of the conductivity of semiconductor wafers. Range of thin film materials that can be measured includes resistive layers, thin metal films and conductive polymer films with the surface resistance Rs < 20 kΩ/square.

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TE01δ mode dielectric resonator
TE01δ mode dielectric resonator technique is intended for very precise complex permittivity measurements of bulk low loss disc or cylinder shape dielectric ceramics.

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Resonators for graphene measurements
Investigation of graphene properties has been a hot subject in the world's scientific community for the last couple of years. In October 2010, the interest in the subject was additionally fuelled by the Nobel Prize in Physics awarded jointly to Andre Geim and Konstantin Novoselov "for groundbreaking experiments regarding the two-dimensional material graphene".
Our expert, Prof. Jerzy Krupka, has developed resonators specifically designed for the measurements of electrical properties of  graphene deposited on small 10 mm x 10 mm dielectric substrates at microwave frequencies (around 13 GHz). Such resonators are commercially available through QWED.

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Standard reference materials
QWED offers standard reference materials for dielectric measurements. For example, samples of single crystal quartz can be ordered by interested customers, either in conjunction with a resonator purchase or independently. Samples of anisotropic substrates are also available.
Award Certificate for Prof. Jerzy Krupka for the invention of Resonators for Precise Measurements of Electromagnetic Properties of Materials at Microwave Frequencies
Diplomas for Prof. Jerzy Krupka