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QWED manufactures several types of resonators (also referred to as test fixtures) for precise measurements of electromagnetic properties of materials at microwave frequencies. Each resonator is equipped with specialised software for extracting the relevant data (complex permittivity or real permittivity and loss tangent, resistivity and sheet resistance) from measurements. Use of inexpensive computer controlled microwave oscillator system, Microwave Frequency Q-Meter, enabling quick and automatic measurements with a dedicated SPDR or SiPDR.

We provide the service of measurements based on the samples sent to us.
Read more about permittivity, dielectric loss tangent and resistivity measurement using Microwave Frequency Q-Meter with Split Post Dielectric Resonator (SPDR).

Read more about resistivity measurement using Microwave Frequency Q-Meter with Single Post Dielectric Resonator (SiPDR).

Read more about sheet resistance for thin films measurement using Microwave Frequency Q-Meter with Split Post Dielectric Resonator (SPDR) and Single Post Dielectric Resonator (SiPDR).
Read more about Resistivity and Surface resistance Measurements of Semiconductors and Conductors (pdf file, 2 MB).
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